Title of article
Monte Carlo simulation of electron emission from solids
Author/Authors
Kuhr، J. -Ch. نويسنده , , Fitting، H. -J. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-256
From page
257
To page
0
Abstract
A `surface analysisʹ, no matter how well authenticated, is rarely satisfying as a single piece of information. Many users require the quantified distribution of observed species as a function of depth. In this paper it is argued that adding knowledge-based inferencing to the data-system is required if the full interpretation of spectra is to be made possible. The basic principles of an expert system are introduced and a preliminary set of rules for the recognition of carbon as a contamination overlayer are proposed. Both the logical steps taken by the expert system in progressing towards identification of the C peak as overlayer contamination and the scientific knowledge on which each rule is based are explained. Once identified as contamination, use of this information in proceeding further with the expert system analysis is discussed.
Keywords
Low energy scattering , Electron emission , Attenuation length , Monte Carlo simulation
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
1999
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
48486
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