Title of article :
EELS characterization of TiN grown by the DC sputtering technique
Author/Authors :
Duarte-Moller، A. نويسنده , , Avalos-Borja، M. نويسنده , , Hirata، G.A. نويسنده , , Contreras، O. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
The satellite line profile in the C-VV Auger electron spectroscopy spectrum depends upon how the initial core hole state and the final multiple hole state are created. Even if the numbers of the holes in the satellite states are the same, the Auger electron speclroscopy spectral profiles of the final multiple hole states are different. The localization of the three hole satellite state is discussed.
Keywords :
TIN , EELS , EXELFS , RDF
Journal title :
MATHEMATICAL METHODS IN THE APPLIED SCIENCES
Journal title :
MATHEMATICAL METHODS IN THE APPLIED SCIENCES