Title of article :
Low-voltage activity in EEG during acute phase of encephalitis predicts unfavorable neurological outcome
Author/Authors :
Machiko Hosoya، نويسنده , , Hideo Ushiku، نويسنده , , Hirokazu Arakawa، نويسنده , , Akihiro Morikawa، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
5
From page :
161
To page :
165
Abstract :
The purpose of this study was to evaluate the risk factors responsible for the onset of postencephalitic epilepsy during the acute phase of encephalitis. We retrospectively studied 19 patients with acute encephalitis admitted to the Division of Pediatrics at our hospital from January 1989 to December 1998. Nine cases were complicated by postencephalitic epilepsy and 10 were non-complicated cases. Significant risk factors for postencephalitic epilepsy were seizures, more severe impairment of consciousness, abnormalities in cranial computed tomography/magnetic resonance imaging/single photon emission computed tomography examination and low-voltage EEG activity, which was defined as EEG findings showing less than 20 μV of background activity without the appearance of a hump or spindle, during the acute phase of encephalitis. In particular, cases with low-voltage EEG activity were all complicated by intractable epilepsy after less than 1 year. Low-voltage EEG activity during the acute phase predicts an unfavorable neurological outcome, reflecting severe widespread impairment in the whole of the cortex.
Keywords :
Acute encephalitis , Epilepsy , prognosis , Low-voltage EEG activity , single photon emission computed tomography
Journal title :
Brain and Development
Serial Year :
2002
Journal title :
Brain and Development
Record number :
494501
Link To Document :
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