Title of article :
Ionizing Radiation and Hydrogen Peroxide Induced Oxidative DNA Base Damage in Two L5178Y Cell Lines
Author/Authors :
Tomasz H. Zastawny، نويسنده , , Marcin Kruszewski، نويسنده , , Ryszard Olinski، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Abstract :
Seven oxidized DNA bases were quantified, by gas GC/MS-SIM, in chromatin from γ-rays and H2O2 treated mouse lymphoma L5178Y (LY) cells, inversely cross-sensitive to these agents. In H2O2 treated cells (2 mM, 1 h, 37°C) we found more damage in LY-R cells than in LY-S cells. On the contrary, in gamma-rays (400 Gy) treated cells we found more damaged DNA bases in LY-S cells. The yield of damaged bases in control cells was similar in both cell lines, with the exception of 8OHAde and FapyGua that were found at a much higher level in LY-S cells. The yields of damaged bases were related to cellular sensitivity to damaging agent; this observation points to a relationship between DNA base damage induction, antioxidant defense system in the intracellular milieu and cell sensitivity.
Keywords :
Radiation sensitivity , H2O2 sensitivity , Free radical , Oxidative base damage , DNA damage
Journal title :
Free Radical Biology and Medicine
Journal title :
Free Radical Biology and Medicine