CCD based high resolution non-destructive testing system for industrial applications

We have developed a large area structured CsI(Tl) imaging sensor for high resolution non-destructive evaluation using X-rays. The sensor is grown on a specially designed substrate. Our work has produced sensors which show up to a factor of 5 more light output per X-ray, the limiting spatial resolution of 20 lp/mm, and several orders of magnitude faster speed of response compared to the existing sensors. With these new sensors, CCD detectors with millisecond data acquisition times and high spatial resolution suitable for modern digital NDT will be possible.