Author/Authors :
Ferenc Szelecsényi، نويسنده , , Thomas E. Boothe، نويسنده , , S?ndor Tak?cs، نويسنده , , Ferenc T?rk?nyi، نويسنده , , Emanuel Tavano، نويسنده ,
Abstract :
On the basis of the present experimental work and available literature results, we have evaluated the cross section/integral thick target physical yield data for image(p, x)image, image(p, x)image, image(p, n)image, image(p, 2n)image, image(p, 3n)image, image(p, xn)image, image(p, n)image, image(p, 2n)image, image(p, xn)image, image(p, n)image and image(p, xn)image nuclear reactions up to 30 MeV. The data sets were evaluated via curve fitting to supply recommended values for practical applications such as routine radioisotope production, nuclear wear/corrosion measurements and nuclear analytical applications.