Title of article :
Evaluated cross section and thick target yield data bases of Zn+p processes for practical applications
Author/Authors :
Ferenc Szelecsényi، نويسنده , , Thomas E. Boothe، نويسنده , , S?ndor Tak?cs، نويسنده , , Ferenc T?rk?nyi، نويسنده , , Emanuel Tavano، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
28
From page :
1005
To page :
1032
Abstract :
On the basis of the present experimental work and available literature results, we have evaluated the cross section/integral thick target physical yield data for image(p, x)image, image(p, x)image, image(p, n)image, image(p, 2n)image, image(p, 3n)image, image(p, xn)image, image(p, n)image, image(p, 2n)image, image(p, xn)image, image(p, n)image and image(p, xn)image nuclear reactions up to 30 MeV. The data sets were evaluated via curve fitting to supply recommended values for practical applications such as routine radioisotope production, nuclear wear/corrosion measurements and nuclear analytical applications.
Journal title :
Applied Radiation and Isotopes
Serial Year :
1998
Journal title :
Applied Radiation and Isotopes
Record number :
540160
Link To Document :
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