Calculation of the average path of gamma-rays in the crystal of semiconductor gamma-ray spectrometers using the total efficiency calibration curve

A method for calculating the average path traversed in the detector crystal by the detected gamma-rays using the total efficiency calibration curves for point sources placed close to the detector was developed. The influence of the crystal volume, shape and dead layer on the average path is discussed. A method for extrapolation of the total efficiency calibration curves to energies up to 5 MeV is presented.