Title of article
The use of amorphous Silicon flat panels as detector in neutron imaging
Author/Authors
E. Lehmann، نويسنده , , P. Vontobel، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
567
To page
571
Abstract
A first test for neutron detection with a flat panel device based on the amorphous silicon technology is described in this report. The most important parameters defining the performance for neutron imaging are described. The first findings are encouraging for further improvements.
Keywords
amorphous silicon , Neutron detection , Dynamic range , Pixel size , tomography
Journal title
Applied Radiation and Isotopes
Serial Year
2004
Journal title
Applied Radiation and Isotopes
Record number
541792
Link To Document