Title of article :
Effects of threshold voltage variability on the characteristics of high sensitivity metal-oxide-semiconductor dosimeters
Author/Authors :
Gérard Sarrabayrouse، نويسنده , , Stelios Siskos، نويسنده , , Ali Boukabache، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
The consequence of the variability of the threshold voltage of high sensitivity metal-oxide-semiconductor (MOS) dosimeters on the accuracy of the measured dose is presented.
Keywords :
radiation dosimetry , Electronic dosimeter , Mos dosimeter
Journal title :
Applied Radiation and Isotopes
Journal title :
Applied Radiation and Isotopes
