Resistance transitions detected by analysis of the voltammetry of tetrathiafulvalene microparticles adhered to electrode surfaces under conditions of dynamic resistance compensation

Dynamic resistance compensated cyclic voltammograms have been obtained when solid tetrathiafulvalene (TTF) is converted to a highly conducting TTF+ salt. Two resistance transitions were detected, one being related to bulk transformation of solid by nucleation-growth TTF+/0 processes and the other occurring with negligible detectable current and mass changes in the reversible potential region. The general usefulness of obtaining resistance¯potential data and maintaining a linear potential¯time (scan rate) relationship by employing dynamic IRu (I=current, Ru=uncompensatedcellresistance) in mechanistic studies of the voltammetry of solids adhered to electrode surfaces is emphasized.