Structural Visualization of alpha-SnSe by Atomic Force Microscopy

The surface structure of SnSe was studied by atomic force microscopy (AFM). The measured periodicities in the (100) and (101) planes as obtained from AFM images are consistent with those derived from the theoretical SnSe crystalline cell. The slight differences observed are the likely result of surface relaxation induced by the friction forces between the tip and the substrate.