Structure and Electrical Transport Property of a Silicopnictide ZrCuSiP

A silicopnictide ZrCuSiP was prepared through the reaction between ZrCuSi alloy and red phosphor in evacuated quartz ampoules. Rietveld analysis of the powder X-ray diffraction pattern revealed that ZrCuSiP has the ZrCuSiAs-type structure (P4/nmm) with the lattice constants of a=0.35671(1) nm and c=00.94460(4) nm. Electrical resistivity measurements at temperatures from 5 to 300 K indicated that ZrCuSiP is a metallic compound.