Title of article
Structure and Electrical Transport Property of a Silicopnictide ZrCuSiP
Author/Authors
Abe، Hideki نويسنده , , Yoshii، Kenji نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
-371
From page
372
To page
0
Abstract
A silicopnictide ZrCuSiP was prepared through the reaction between ZrCuSi alloy and red phosphor in evacuated quartz ampoules. Rietveld analysis of the powder X-ray diffraction pattern revealed that ZrCuSiP has the ZrCuSiAs-type structure (P4/nmm) with the lattice constants of a=0.35671(1) nm and c=00.94460(4) nm. Electrical resistivity measurements at temperatures from 5 to 300 K indicated that ZrCuSiP is a metallic compound.
Keywords
Ag+ diffusion , Neutron diffraction , maximum entropy techniques. , superionic conduction
Journal title
JOURNAL OF SOLID STATE CHEMISTRY
Serial Year
2002
Journal title
JOURNAL OF SOLID STATE CHEMISTRY
Record number
57530
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