Title of article :
Social deprivation and psychiatric service use for different diagnostic groups
Author/Authors :
Jaap Peen، نويسنده , , Jack Dekker، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2001
Pages :
8
From page :
1
To page :
8
Abstract :
Recent research has shown that the relationship between social deprivation and admission rates varies according to diagnosis. We have replicated a study of this kind. Furthermore, in addition to admission rates, we also look at variations in length of stay and the proportion of readmitted patients. Psychiatric admission data for the 79 Amsterdam neighbourhoods was obtained from the City Psychiatric Register. This data covered all the admissions between 1992 and 1995 of people from Amsterdam aged 19 and older, with the exception of short-term crisis admissions to the Crisis Centre. These admissions were divided into six diagnostic groups. The admission rates, the average length of stay and the proportion of patients readmitted were compared to the level of socio-economic deprivation in the area concerned, a factor which was determined using factor analysis. Admission rates for schizophrenia, other psychoses and neurosis disorders showed a significant relation with the level of socioeconomic deprivation. Admission rates for affective disorders, organic psychoses and personality disorders showed no significant relation with deprivation. The findings on average length of stay and proportion of readmitted patients showed no clear relation with deprivation according to diagnosis category. As was found in previous studies, the relationship with socio-economic deprivation varies according to diagnosis. The average length of stay and the risk of readmission, given the diagnosis, do not vary according to level of deprivation.
Keywords :
Mental health , Psychiatric admission , social deprivation , Social indicators , Netherlands
Journal title :
Social Science and Medicine
Serial Year :
2001
Journal title :
Social Science and Medicine
Record number :
600746
Link To Document :
بازگشت