Title of article :
The use of X-ray Crystallography to Determine Absolute Configuration (II)
Author/Authors :
Howard. D. Flack، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Abstract :
An update is provided to H. D. Flack and G. Bernardinelli, Chirality, 2008, 20, 681–690 on The use of X-ray Crystallography to determine absolute configuration. In particular, comments are made about optical rotation, powder diffraction, the Bijvoet ratio and intensity measurements for single-crystal X-ray diffractometry.
Keywords :
absolute configuration , absolute structure , crystal structure , Resonant scattering , X-ray crystallography
Journal title :
Acta Chimica Slovenica
Journal title :
Acta Chimica Slovenica
