Characterization of the Radiation Effect in A Binder by X-Ray Diffraction

The influence of x – ray radiation on samples of binder (Li2CO3, H3BO3, Na2B4O7 • 10H2O) was examined. The components were ground and placed as thin film on the Mylar foil and exposed to beam of primary x – ray on semi – automatic x – ray spectrometer (Au – anode, 20 mA/ 45 KV) successively for period 1 to 8 hours. Comparative results were observed for x – ray diffraction analysis, scanning electron microscope analysis and sieve analysis.