• Title of article

    Applying Fuzzy Analytic Hierarchy Process and Grey Relation Analysis to Evaluate the Supply Chain Performance of the Wafer Testing House

  • Author/Authors

    Yun-Chin Chen، نويسنده , , Jun-Yuan Kuo، نويسنده , , Bang-Ting Luo، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2011
  • Pages
    6
  • From page
    1398
  • To page
    1403
  • Abstract
    Problem statement: In the information age, the process of E-Commerce (EC) operates quickly and the present enterprises of Taiwan have to face the Free Cross-Strait Market (FCSM) with Mainland China, which will definitely change the model as well as the performance of the supply chain. Hence, this study focuses on the issue of supply chain performance evaluation of the wafer testing house in Taiwan. Approach: This investigation applied the Fuzzy Analytic Hierarchy Process (FAHP) to derive the weights of influential indicators for evaluating the supply chain performance of the wafer testing house and the Grey Relation Analysis (GRA) was used to evaluate the performance between the FCSM and EC aspects. Results: The analyzed results had identified the indicator weight of the supply chain performance evaluation in the wafer testing house and the indicator performances between different aspects were compared. The research results indicated that the FCSM aspect had better performance than EC aspect of the supply chain evaluation in the wafer testing house. Conclusion/Recommendations: Based on the analyzed results, the managers can find out the problems and improve the supply chain performance of the wafer testing house. This study not only can be a good basis for improvements of the case company, but also can be the reference for evaluating the supply chain performance of the wafer testing house.
  • Keywords
    Fuzzy analytic hierarchy process , Supply chain management , Performance evaluation , wafer testing house , Fuzzy theory , E-Commerce (EC) , Grey relation analysis
  • Journal title
    American Journal of Applied Sciences
  • Serial Year
    2011
  • Journal title
    American Journal of Applied Sciences
  • Record number

    688010