Title of article :
AlGaN/GaN Heterostructure Field-Effect Transistors (HFETs) Model Including Impact Ionization Rates
Author/Authors :
Sayah، C. نويسنده Unité de Recherche Matériaux et Energies Renouvelables, Faculté des sciences de lingénieur, Université Abou-Bekr Belkaïd de Tlemcen.BP 230, Tlemcen 1 , , Bouazza، B. نويسنده Unité de Recherche Matériaux et Energies Renouvelables, Faculté des sciences de lingénieur, Université Abou-Bekr Belkaïd de Tlemcen.BP 230, Tlemcen 1 , , Guen-Bouazza، A. نويسنده Unité de Recherche Matériaux et Energies Renouvelables, Faculté des sciences de lingénieur, Université Abou-Bekr Belkaïd de Tlemcen.BP 230, Tlemcen 1 , , Chabane-Sari، N. C. نويسنده Unité de Recherche Matériaux et Energies Renouvelables, Faculté des sciences de lingénieur, Université Abou-Bekr Belkaïd de Tlemcen.BP 230, Tlemcen 1 ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
6
From page :
104
To page :
109
Abstract :
Hot carrier effects in semiconductors are crucial phenomena or electron devices, since they play an important role in the device. One of the most powerful tools to describe hot carrier effects is ensemble Monte Carlo (EMC) simulation. This article reports the development and application of a Two-dimensional self-consistent Monte Carlo simulator for electron transport in wurtzite phase AlGaN/GaN heterostructure (HFETs). The properties of AlGaN/GaN HFETs at the higher ambient temperature and doping concentration are described and evaluated. It is shown that the saturation drain current and peak transconductance of the devices investigated decrease similarly with increased temperature with respect to their room temperature values. On the other hand, the higher acceptor and donor concentration are favourable for restraining the shifts of threshold voltage in the AlGaN/GaN HFET.
Journal title :
World Applied Programming
Serial Year :
2012
Journal title :
World Applied Programming
Record number :
688764
Link To Document :
بازگشت