Title of article
Excess thermal-noise in the electrical breakdown of random resistor networks
Author/Authors
Permetta، C. نويسنده , , Kiss، L.B. نويسنده , , Gingl، Z. نويسنده , , Reggiani، L. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-60
From page
61
To page
0
Abstract
By using integral representations the perturbation expansion and the Bogoliubov inequality ain nonextensive Tsallis statistics are investigated in a unified way. This procedure extends the analysis performed recently by Lenzi et al. [Phys. Rev. Lett. 80, 218 (1998)] to the quantum (discrete spectra) case, for q < 1. An example is presented in order to illustrate the method.
Keywords
photoacoustic testing , Nondestructive testing , layer structures (multilayers, superlattices, quantum wells, wires, and dots) , Ultrasonic testing , Electrical properties of specific thin films , Noise processes and phenomena
Journal title
EUROPEAN PHYSICAL JOURNAL B
Serial Year
1999
Journal title
EUROPEAN PHYSICAL JOURNAL B
Record number
6908
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