• Title of article

    Excess thermal-noise in the electrical breakdown of random resistor networks

  • Author/Authors

    Permetta، C. نويسنده , , Kiss، L.B. نويسنده , , Gingl، Z. نويسنده , , Reggiani، L. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    -60
  • From page
    61
  • To page
    0
  • Abstract
    By using integral representations the perturbation expansion and the Bogoliubov inequality ain nonextensive Tsallis statistics are investigated in a unified way. This procedure extends the analysis performed recently by Lenzi et al. [Phys. Rev. Lett. 80, 218 (1998)] to the quantum (discrete spectra) case, for q < 1. An example is presented in order to illustrate the method.
  • Keywords
    photoacoustic testing , Nondestructive testing , layer structures (multilayers, superlattices, quantum wells, wires, and dots) , Ultrasonic testing , Electrical properties of specific thin films , Noise processes and phenomena
  • Journal title
    EUROPEAN PHYSICAL JOURNAL B
  • Serial Year
    1999
  • Journal title
    EUROPEAN PHYSICAL JOURNAL B
  • Record number

    6908