Title of article :
Bayesian outlier analysis in binary regression
Author/Authors :
Aparecida D.P. Souza & Helio S. Migon، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
14
From page :
1355
To page :
1368
Abstract :
We propose alternative approaches to analyze residuals in binary regression models based on random effect components. Our preferred model does not depend upon any tuning parameter, being completely automatic. Although the focus is mainly on accommodation of outliers, the proposed methodology is also able to detect them. Our approach consists of evaluating the posterior distribution of random effects included in the linear predictor. The evaluation of the posterior distributions of interest involves cumbersome integration, which is easily dealt with through stochastic simulation methods.We also discuss different specifications of prior distributions for the random effects. The potential of these strategies is compared in a real data set. The main finding is that the inclusion of extra variability accommodates the outliers, improving the adjustment of the model substantially, besides correctly indicating the possible outliers.
Keywords :
binary regression models , Bayesian residual , Mixture of normals , random effect , MarkovChain Monte Carlo
Journal title :
JOURNAL OF APPLIED STATISTICS
Serial Year :
2010
Journal title :
JOURNAL OF APPLIED STATISTICS
Record number :
712464
Link To Document :
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