Title of article :
Bayesian outlier analysis in binary regression
Author/Authors :
Aparecida D.P. Souza & Helio S. Migon، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Abstract :
We propose alternative approaches to analyze residuals in binary regression models based on random effect
components. Our preferred model does not depend upon any tuning parameter, being completely automatic.
Although the focus is mainly on accommodation of outliers, the proposed methodology is also able to detect
them. Our approach consists of evaluating the posterior distribution of random effects included in the linear
predictor. The evaluation of the posterior distributions of interest involves cumbersome integration, which
is easily dealt with through stochastic simulation methods.We also discuss different specifications of prior
distributions for the random effects. The potential of these strategies is compared in a real data set. The
main finding is that the inclusion of extra variability accommodates the outliers, improving the adjustment
of the model substantially, besides correctly indicating the possible outliers.
Keywords :
binary regression models , Bayesian residual , Mixture of normals , random effect , MarkovChain Monte Carlo
Journal title :
JOURNAL OF APPLIED STATISTICS
Journal title :
JOURNAL OF APPLIED STATISTICS