Title of article :
A Bayesian hierarchical approach to dual response surface modelling
Author/Authors :
Younan Chen&Keying Ye، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Abstract :
In modern quality engineering, dual response surface methodology is a powerful tool to model an industrial
process by using both the mean and the standard deviation of the measurements as the responses. The least
squares method in regression is often used to estimate the coefficients in the mean and standard deviation
models, and various decision criteria are proposed by researchers to find the optimal conditions. Based
on the inherent hierarchical structure of the dual response problems, we propose a Bayesian hierarchical
approach to model dual response surfaces. Such an approach is compared with two frequentist least squares
methods by using two real data sets and simulated data.
Keywords :
Genetic algorithm , off-line qualitycontrol , optimization , Bayesian Hierarchical Model , dual response surface
Journal title :
JOURNAL OF APPLIED STATISTICS
Journal title :
JOURNAL OF APPLIED STATISTICS