Title of article :
A Bayesian hierarchical approach to dual response surface modelling
Author/Authors :
Younan Chen&Keying Ye، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Pages :
13
From page :
1963
To page :
1975
Abstract :
In modern quality engineering, dual response surface methodology is a powerful tool to model an industrial process by using both the mean and the standard deviation of the measurements as the responses. The least squares method in regression is often used to estimate the coefficients in the mean and standard deviation models, and various decision criteria are proposed by researchers to find the optimal conditions. Based on the inherent hierarchical structure of the dual response problems, we propose a Bayesian hierarchical approach to model dual response surfaces. Such an approach is compared with two frequentist least squares methods by using two real data sets and simulated data.
Keywords :
Genetic algorithm , off-line qualitycontrol , optimization , Bayesian Hierarchical Model , dual response surface
Journal title :
JOURNAL OF APPLIED STATISTICS
Serial Year :
2011
Journal title :
JOURNAL OF APPLIED STATISTICS
Record number :
712647
Link To Document :
بازگشت