Title of article :
High-Speed Path-Length Scanning with a Multiple-Pass Cavity Delay Line
Author/Authors :
Hsiung، Pei-Lin نويسنده , , Li، Xingde نويسنده , , Chudoba، Christian نويسنده , , Hartl، Ingmar نويسنده , , Ko، Tony H. نويسنده , , Fujimoto، James G. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
Techniques for high-speed delay scanning are important for low-coherence interferometry, optical coherence tomography, pump probe measurements, and other applications. We demonstrate a novel scanning delay line using a multiple-pass cavity. Differential delays are accumulated with each pass so that millimeter delays can be generated with tens of micrometer mirror displacements. With special design criteria, misalignment sensitivity can be dramatically reduced. The system is demonstrated to scan 6 m /s at 2-kHz repetition rates. Real-time optical coherence tomography imaging with 500 pixel images at four frames /s is performed. Using a Cr:forsterite laser source, we obtained axial image resolutions of 6 ?m with 92-dB sensitivity. [Optical Society of America ]
Keywords :
Scanning microscopy , microscopy , scattering , diffusion , Index measurements , Fiber characterization , Fiber optics and optical communications , Fiber optics sensors
Journal title :
Applied Optics
Journal title :
Applied Optics