Title of article :
Fundamental spatial resolution of an x-ray pore optic
Author/Authors :
Mieremet، Arjan L. نويسنده , , Beijersbergen، Marco W. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
-7097
From page :
7098
To page :
0
Abstract :
We investigate the fundamental spatial resolution of an x-ray pore optic as a function of the pore dimensions, the photon energy, and the focal length. We achieve this by calculating the shape of the focal spot, using diffraction integrals such that the half-energy width is determined. Quantitative results are presented for the XRay Evolving Universe Spectroscopy (XEUS) telescope, showing that a resolution of better than 2 arc sec half-energy width is possible by use of an optic with pore sizes of approximately 0.5 mm.
Keywords :
statistical optics , Speckle , instrumentation , Measurement , Metrology , Surface measurements , Roughness , scattering , rough surfaces , Ultrafast optics , Ultrafast phenomena , COHERENCE
Journal title :
Applied Optics
Serial Year :
2005
Journal title :
Applied Optics
Record number :
74921
Link To Document :
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