• Title of article

    Patterns in Mie scattering: evolution when normalized by the Rayleigh cross section

  • Author/Authors

    Berg، Matthew J. نويسنده , , Sorensen، Christopher M. نويسنده , , Chakrabarti، Amit نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    -7486
  • From page
    7487
  • To page
    0
  • Abstract
    An alternative to using the traditional scattering angle theta to describe light scattering from a uniform dielectric sphere is the dimensionless parameter qR, where R is the radius of the sphere, q =2k sin((theta)/2), and k is the wavenumber of the incident light. Simple patterns appear in the scattered intensity if qR is used in place of theta. These patterns are characterized by the envelopes approximating the scattered intensity distributions and are quantified by the phase-shift parameter (rho)=2kR|m-1|, where m is the real refractive index of the sphere. Here we find new patterns in these envelopes when the scattered intensity is normalized to the Rayleigh differential cross section. Mie scattering is found to be similar to Rayleigh scattering when (rho)<1 and follows simple patterns for (rho)>1, which evolve predictably as a function of (rho). These patterns allow us to present a unifying picture of the evolution of Mie scattering for changes in kR and m.
  • Keywords
    Roughness , scattering , rough surfaces , Ultrafast optics , Ultrafast phenomena , COHERENCE , statistical optics , Speckle , instrumentation , Measurement , Surface measurements , Metrology
  • Journal title
    Applied Optics
  • Serial Year
    2005
  • Journal title
    Applied Optics
  • Record number

    75051