Title of article :
Patterns in Mie scattering: evolution when normalized by the Rayleigh cross section
Author/Authors :
Berg، Matthew J. نويسنده , , Sorensen، Christopher M. نويسنده , , Chakrabarti، Amit نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
-7486
From page :
7487
To page :
0
Abstract :
An alternative to using the traditional scattering angle theta to describe light scattering from a uniform dielectric sphere is the dimensionless parameter qR, where R is the radius of the sphere, q =2k sin((theta)/2), and k is the wavenumber of the incident light. Simple patterns appear in the scattered intensity if qR is used in place of theta. These patterns are characterized by the envelopes approximating the scattered intensity distributions and are quantified by the phase-shift parameter (rho)=2kR|m-1|, where m is the real refractive index of the sphere. Here we find new patterns in these envelopes when the scattered intensity is normalized to the Rayleigh differential cross section. Mie scattering is found to be similar to Rayleigh scattering when (rho)<1 and follows simple patterns for (rho)>1, which evolve predictably as a function of (rho). These patterns allow us to present a unifying picture of the evolution of Mie scattering for changes in kR and m.
Keywords :
Roughness , scattering , rough surfaces , Ultrafast optics , Ultrafast phenomena , COHERENCE , statistical optics , Speckle , instrumentation , Measurement , Surface measurements , Metrology
Journal title :
Applied Optics
Serial Year :
2005
Journal title :
Applied Optics
Record number :
75051
Link To Document :
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