Title of article :
Multiple-scattering effects on static light-scattering optical structure factor measurements
Author/Authors :
Sorensen، Christopher M. نويسنده , , Chakrabarti، Amit نويسنده , , Mokhtari، Tahereh نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
-7857
From page :
7858
To page :
0
Abstract :
We show that the extent and effect of multiple scattering on angularly resolved light-scattering intensity measurements, the optical structure factor, can be quantitatively described by a single parameter, the average number of scattering events along the scattering volume. This quantity is easily measured or calculated and hence provides a useful experimental indicator of multiple scattering, which is a hindrance to accurate structure factor measurements.
Keywords :
X-ray lasers , XUV , Integrated optics , laser optics , Lasers , Integrated optics devices , UV , frequency conversion , Multiharmonic generation , nonlinear optics
Journal title :
Applied Optics
Serial Year :
2005
Journal title :
Applied Optics
Record number :
75175
Link To Document :
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