Title of article :
Side diffusion modeling by the explicit consideration of a space-charge buildup under the mask during strip waveguide formation in the Ag+-Na+ field-assisted ion-exchange process
Author/Authors :
Mrozek، Piotr نويسنده , , Mrozek، Ewa نويسنده , , Lukaszewicz، Tadeusz نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Abstract :
A space-charge buildup under the blocking mask in a field-assisted Ag+-Na+ ion-exchange modeling is assumed. It results in the distortion of electric field lines in the direction under the mask edges. As a result, side diffusion occurs and the numerical model shows the same range of side diffusion as the experimental data. Explicit consideration of the space-charge buildup under the mask and solving the Poisson equation for the electric field determination make it possible to use more realistic boundary conditions in the numerical model, compared to the boundary conditions generally used.
Keywords :
Measurement , Metrology , instrumentation , Optical design , Fabrication , Ultrafast optics , Ultrafast measurements , Atmospheric , ocean optics , Wave-front sensing , detectors , CCD , charge-coupled device , Optical systems design , Optical design of instruments
Journal title :
Applied Optics
Journal title :
Applied Optics