Comparative analysis of techniques for measuring the modulation transfer functions of charge-coupled devices based on the generation of laser speckle

Two methods for measuring the modulation transfer function (MTF) of a charge-coupled device (CCD) that are based on the generation of laser speckle are analyzed and compared. The method based on a single-slit aperture is a quick method, although the measurements are limited to values of less than the Nyquist frequency of the device. The double-slit method permits the measurement of values of as much as some 1.8 times the Nyquist frequency, although it is a slower method because of the necessity to move the CCD. The difference between the MTF values obtained with the two methods is less than 0.1 in magnitude; the root-mean-square error between the two curves is 0.046 (4.6%).