• Title of article

    Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates

  • Author/Authors

    Rita Van Ham، نويسنده , , Annemie Adriaens، نويسنده , , Paolo Prati، نويسنده , , Alessandro Zucchiatti، نويسنده , , Luc Van Vaeck، نويسنده , , Freddy Adams، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    11
  • From page
    899
  • To page
    909
  • Abstract
    The paper presents static secondary ion mass spectrometry (S-SIMS) analyses of aerosol particles, which have been collected on an insulating polycarbonate filter (nuclepore) using a two-stage streaker sampler. A method was developed to analyze one streaker sample in its entirety without the need of cutting the filter. The latter allows the analysis of the same sample set with complementary techniques. Simultaneous detection of low Z atomic ions (Z<11) together with mean Z atomic ions (11
  • Keywords
    TOF-SIMS , Streaker sampler , Nuclepore Filter , Charging , Inorganic speciation
  • Journal title
    Atmospheric Environment
  • Serial Year
    2002
  • Journal title
    Atmospheric Environment
  • Record number

    756911