Title of article
Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates
Author/Authors
Rita Van Ham، نويسنده , , Annemie Adriaens، نويسنده , , Paolo Prati، نويسنده , , Alessandro Zucchiatti، نويسنده , , Luc Van Vaeck، نويسنده , , Freddy Adams، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
11
From page
899
To page
909
Abstract
The paper presents static secondary ion mass spectrometry (S-SIMS) analyses of aerosol particles, which have been collected on an insulating polycarbonate filter (nuclepore) using a two-stage streaker sampler. A method was developed to analyze one streaker sample in its entirety without the need of cutting the filter. The latter allows the analysis of the same sample set with complementary techniques. Simultaneous detection of low Z atomic ions (Z<11) together with mean Z atomic ions (11
Keywords
TOF-SIMS , Streaker sampler , Nuclepore Filter , Charging , Inorganic speciation
Journal title
Atmospheric Environment
Serial Year
2002
Journal title
Atmospheric Environment
Record number
756911
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