Title of article :
Physically based reflectance model utilizing polarization measurement
Author/Authors :
Nakano، Takayuki نويسنده , , Tamagawa، Yasuhisa نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
-2956
From page :
2957
To page :
0
Abstract :
A surface bidirectional reflectance distribution function (BRDF) depends on both the optical properties of the material and the microstructure of the surface and appears as combination of these factors. We propose a method for modeling the BRDF based on a separate optical-property (refractive-index) estimation by polarization measurement. Because the BRDF and the refractive index for precisely the same place can be determined, errors cased by individual difference or spatial dependence can be eliminated. Our BRDF model treats the surface as an aggregation of microfacets, and the diffractive effect is negligible because of randomness. An example model of a painted aluminum plate is presented.
Keywords :
rough surfaces , scattering , instrumentation , Measurement , Reflection , Metrology
Journal title :
Applied Optics
Serial Year :
2005
Journal title :
Applied Optics
Record number :
75827
Link To Document :
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