Title of article
Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique
Author/Authors
Kuo، Wen-Kai نويسنده , , Tang، Deng-Tzung نويسنده , , Wu، Chien-Jang نويسنده , , Lai، Thomson نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
-4204
From page
4205
To page
0
Abstract
A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.
Keywords
Metrology , Ellipsometry and polarimetry , Nondestructive testing , Polarimetry , instrumentation , Measurement
Journal title
Applied Optics
Serial Year
2005
Journal title
Applied Optics
Record number
76117
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