Evaluation of Bent-Crystal X-Ray Backlighting and Microscopy Techniques for the Sandia Z Machine

X-ray backlighting and microscopy systems for the 1 -10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more efficient than pinhole cameras with the same spatial resolution and magnification [Appl. Opt. 37, 1784 (1998) . We show that highresolution (<=10 (mu)m) x-ray backlighting systems using bent crystals can be more efficient than analogous pointprojection imaging systems. Examples of bent-crystal-backlighting results that demonstrate 10- (mu)m resolution over a 20-mm field of view are presented.