Title of article :
The Metal /CNT Interface Properties in CNTFETs
Author/Authors :
Bakhtiari، Mehdi نويسنده Faculty of Engineering, Science and Research Branch, Islamic Azad University, Saveh, Iran , , Panahi، Abdorreza نويسنده Department of Mathematics, Saveh Branch, Islamic Azad University, Saveh, Iran , , Gandomkar koli، Majid نويسنده ,
Issue Information :
روزنامه با شماره پیاپی 0 سال 2013
Pages :
5
From page :
410
To page :
414
Abstract :
In this paper the electron transport properties in zigzag-type Carbon Nanotube Field Effect Transistors(CNTFETs) are investigated. CNTFETs can be fabricated using ohmic or Schottky type contacts .We focus here on Schottky barrier CNTFETs which operate by thermionic emission through a Schottky barrier. The Schottky barrier is formed at the interface between the metal electrodes associated with source/drain and the semiconductor-type carbon nanotube (CNT) forming the channel of the FET. The behavior of these devices has been studied by using Landau–Butinger equation. In particular, the variations in the drain current have been calculated as a function of the gate-to-source voltage, temperature and the diameter of the CNT.
Journal title :
Technical Journal of Engineering and Applied Sciences (TJEAS)
Serial Year :
2013
Journal title :
Technical Journal of Engineering and Applied Sciences (TJEAS)
Record number :
792128
Link To Document :
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