Title of article :
Inheritance of angular leaf spot resistance in common bean line BAT 332 and identification of RAPD markers linked to the resistance gene
Author/Authors :
Caixeta، Eveline Teixeira نويسنده , , Borem، Aluizio نويسنده , , Fagundes، Samir de Azevedo نويسنده , , Niestche، Silvia نويسنده , , Barros، Everaldo Goncalves de نويسنده , , Moreira، Maurilio Alves نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-296
From page :
297
To page :
0
Abstract :
The existence of genetic variability for angular leaf spot (ALS) resistance in the common bean germplasm allows the development of breeding lines resistant to this disease. The BAT 332 line is an important resistance source to common bean ALS. In this work we determined the inheritance pattern and identified RAPD markers linked to a resistance gene present in BAT 332. Populations F1, F2, BCs and BCr derived from crosses between BAT 332 and cultivar Ruda were used. Ruda is a commercial cultivar with carioca type grains and susceptible to ALS. The resistance of BAT 332 to race 61.41 of the pathogen was confirmed. Segregation analysis of the plants indicated that a single dominant gene confers resistance. For identification of RAPD markers linked to the resistance gene, bulk segregant analysis (BSA) was used. Two RAPD markers, OPAA07950 and OPAO12950, linked in coupling phase at 5.10 and 5.83 cM of this gene, respectively, were identified. These molecular markers are important for common bean breeders and geneticists as source of genetic information and for marker assisted selection in breeding programs.
Keywords :
angular leaf spot , RAPD markers , resistance inheritance , Phaeoisariopsis griseola
Journal title :
EUPHYTICA : INTERNATIONAL JOURNAL OF PLANT BREEDING
Serial Year :
2003
Journal title :
EUPHYTICA : INTERNATIONAL JOURNAL OF PLANT BREEDING
Record number :
81539
Link To Document :
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