• Title of article

    Relative test elements for tight closure

  • Author/Authors

    Anurag K. Singh، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    9
  • From page
    101
  • To page
    109
  • Abstract
    Test ideals play a crucial role in the theory of tight closure developed by Melvin Hochster and Craig Huneke. Recently, Karen Smith showed that test ideals are closely related to certain multiplier ideals that arise in vanishing theorems in algebraic geometry. In this paper we develop a generalization of the notion of test ideals: for complete local rings R and S, where S is a module-finite extension of R, we define a module of relative test elements T(S,R) which is a submodule of HomR(S,R).
  • Journal title
    Journal of Pure and Applied Algebra
  • Serial Year
    2001
  • Journal title
    Journal of Pure and Applied Algebra
  • Record number

    816794