Title of article :
Relative test elements for tight closure
Author/Authors :
Anurag K. Singh، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
9
From page :
101
To page :
109
Abstract :
Test ideals play a crucial role in the theory of tight closure developed by Melvin Hochster and Craig Huneke. Recently, Karen Smith showed that test ideals are closely related to certain multiplier ideals that arise in vanishing theorems in algebraic geometry. In this paper we develop a generalization of the notion of test ideals: for complete local rings R and S, where S is a module-finite extension of R, we define a module of relative test elements T(S,R) which is a submodule of HomR(S,R).
Journal title :
Journal of Pure and Applied Algebra
Serial Year :
2001
Journal title :
Journal of Pure and Applied Algebra
Record number :
816794
Link To Document :
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