Title of article :
Antireflecting coating from Ta2O5 and SiO2
multilayer films
Author/Authors :
K. KOC، نويسنده , , F. Z. Tepehan، نويسنده , , G. G. Tepehan، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Abstract :
Sol-gel method is important for depositing antireflective coating that allows control over
thickness as well as the index of refraction. Antireflective coatings which are produced
from Ta2O5 and SiO2 multi-layer thin films using sol-gel spin coating method are presented.
The refractive index and the thickness are controlled by the composition and the
concentration of the solution respectively. The thickness, refractive index and extinction
coefficient of the films were calculated through transmission and reflection measurement
by an NKD analyser. Mechanical properties of the films were checked by the cross tape test
and dry sun test at 760 W/m2. The result shows that the sample heat treated at 450◦C for
15 min approaches a reflectance with less than 0.5% at around 840 nm.
C 2005 Springer Science + Business Media, Inc.
Journal title :
Journal of Materials Science
Journal title :
Journal of Materials Science