Title of article :
Studies on the relaxor behavior of sol-gel derived
Ba(Zrx Ti1−x)O3 (0.30≤x≤0.70) thin films
Author/Authors :
A. DIXIT، نويسنده , , S. B. Majumder، نويسنده , , R. S. Katiyar، نويسنده , , A. S. BHALLA، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2006
Abstract :
We have studied the relaxor behavior of sol-gel derived Ba(Zrx Ti1−x)O3 (0.30≤ x≤0.70) thin
films. The plausible mechanism of the relaxor behavior has been analyzed from the dielectric
data and micro-Raman spectra. Substitution of Zr+4 for Ti+4 in BaTiO3 lattice reduces its
long-range polarization order yielding a diffused paraelectric to ferroelectric phase transition.
The solid solution system is visualized as a mixture of Ti+4 rich polar region and Zr+4 rich
regions and with the increase in Zr contents the volume fraction of the polar regions are
progressively reduced. At about 25.0 at% Zr contents the polar regions exhibit typical relaxor
behavior. The degree of relaxation increases with Zr content and maximizes at 40.0 at% Zr
doped film. The frequency dependence of the polar regions follows Vogel-Fulcher relation with
a characteristic cooperative freezing at freezing temperature (Tf). Below Tf, a long range
polarization ordering was ascertained from the polarization hysteresis measurement.
C 2006 Springer Science + Business Media, Inc.
Journal title :
Journal of Materials Science
Journal title :
Journal of Materials Science