• Title of article

    Studies on the relaxor behavior of sol-gel derived Ba(Zrx Ti1−x)O3 (0.30≤x≤0.70) thin films

  • Author/Authors

    A. DIXIT، نويسنده , , S. B. Majumder، نويسنده , , R. S. Katiyar، نويسنده , , A. S. BHALLA، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2006
  • Pages
    10
  • From page
    87
  • To page
    96
  • Abstract
    We have studied the relaxor behavior of sol-gel derived Ba(Zrx Ti1−x)O3 (0.30≤ x≤0.70) thin films. The plausible mechanism of the relaxor behavior has been analyzed from the dielectric data and micro-Raman spectra. Substitution of Zr+4 for Ti+4 in BaTiO3 lattice reduces its long-range polarization order yielding a diffused paraelectric to ferroelectric phase transition. The solid solution system is visualized as a mixture of Ti+4 rich polar region and Zr+4 rich regions and with the increase in Zr contents the volume fraction of the polar regions are progressively reduced. At about 25.0 at% Zr contents the polar regions exhibit typical relaxor behavior. The degree of relaxation increases with Zr content and maximizes at 40.0 at% Zr doped film. The frequency dependence of the polar regions follows Vogel-Fulcher relation with a characteristic cooperative freezing at freezing temperature (Tf). Below Tf, a long range polarization ordering was ascertained from the polarization hysteresis measurement. C 2006 Springer Science + Business Media, Inc.
  • Journal title
    Journal of Materials Science
  • Serial Year
    2006
  • Journal title
    Journal of Materials Science
  • Record number

    830493