Title of article :
The effects of crystallography on grain-boundary migration in alumina
Author/Authors :
JEFFREY K. FARRER، نويسنده , , C. BARRY CARTER، نويسنده , , N. Ravishankar، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2006
Pages :
14
From page :
661
To page :
674
Abstract :
The sintering process of ceramics involves mass transport across grain boundaries resulting in the migration of these boundaries. When there is a liquid at the interface—as in liquid-phase sintering—the mass transport can be enhanced. In this study, electron backscatter diffraction has been used to examine grain-boundary migration of controlled interfaces in alumina. The interfaces were prepared by hot pressing single-crystal and polycrystalline alumina to single-crystal alumina substrates of known orientation. EBSD patterns, taken near the sintered interfaces, have been used to study the effects of crystallography on migration direction and rate. C 2006 Springer Science + Business Media, Inc.
Journal title :
Journal of Materials Science
Serial Year :
2006
Journal title :
Journal of Materials Science
Record number :
830562
Link To Document :
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