Title of article :
Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
Author/Authors :
Yong-Il Kim، نويسنده , , WON BIN IM، نويسنده , , DUK YOUNG JEON، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2006
Pages :
5
From page :
1643
To page :
1647
Journal title :
Journal of Materials Science
Serial Year :
2006
Journal title :
Journal of Materials Science
Record number :
830676
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=830676
