• Title of article

    Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in b-Si3N4

  • Author/Authors

    W. Y. Ching، نويسنده , , Jun Chen، نويسنده , , Paul Rulis، نويسنده , , Lizhi Ouyang، نويسنده , , Anil Misra، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2006
  • Pages
    7
  • From page
    5061
  • To page
    5067
  • Abstract
    Based on large and relaxed grain boundary (GB) models in alumina and intergranular glassy film (IGF) models in polycrystalline b-Si3N4, ab initio modeling and theoretical tensile experiments were carried out for both clean and Y-doped models. It is shown that the increased covalent bonding between Y and O or N through the participation of the Y-4d and Y-3p orbitals is the mechanism by which Y ions enhance the mechanical and elastic properties of the Y-doped GB and IGF models. In alumina, this explains the improved creep behavior in the presence of Y doping. Preliminary results on the electronic structure and bonding of a specific GB model (S37) in a-Al2O3 is presented. For the IGF models, the distribution patterns of Y ions in the glassy region were investigated by total energy calculations. Y ions prefer to be at the interfacial region between the IGF and bulk crystal. Defect-like states of different origin can be identified near the valence band and the conduction band edges. These theoretical predictions obtained from the calculation of the fundamental electronic structure of the materials can be used to derive local strain fields of dissimilar ‘‘particles’’ that may be linked to continuum level theories via finite element methods
  • Journal title
    Journal of Materials Science
  • Serial Year
    2006
  • Journal title
    Journal of Materials Science
  • Record number

    831140