Title of article
Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in b-Si3N4
Author/Authors
W. Y. Ching، نويسنده , , Jun Chen، نويسنده , , Paul Rulis، نويسنده , , Lizhi Ouyang، نويسنده , , Anil Misra، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2006
Pages
7
From page
5061
To page
5067
Abstract
Based on large and relaxed grain boundary
(GB) models in alumina and intergranular glassy film
(IGF) models in polycrystalline b-Si3N4, ab initio
modeling and theoretical tensile experiments were
carried out for both clean and Y-doped models. It is
shown that the increased covalent bonding between Y
and O or N through the participation of the Y-4d and
Y-3p orbitals is the mechanism by which Y ions
enhance the mechanical and elastic properties of the
Y-doped GB and IGF models. In alumina, this explains
the improved creep behavior in the presence of Y
doping. Preliminary results on the electronic structure
and bonding of a specific GB model (S37) in a-Al2O3 is
presented. For the IGF models, the distribution
patterns of Y ions in the glassy region were investigated
by total energy calculations. Y ions prefer to be
at the interfacial region between the IGF and bulk
crystal. Defect-like states of different origin can be
identified near the valence band and the conduction
band edges. These theoretical predictions obtained
from the calculation of the fundamental electronic
structure of the materials can be used to derive local
strain fields of dissimilar ‘‘particles’’ that may be linked
to continuum level theories via finite element methods
Journal title
Journal of Materials Science
Serial Year
2006
Journal title
Journal of Materials Science
Record number
831140
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