Title of article
Sequential importance sampling for nonparametric Bayes models: The next generation
Author/Authors
Liu، J. S. نويسنده , , MacEachern، S. N. نويسنده , , Clyde، M. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-250
From page
251
To page
0
Abstract
There are two generations of Gibbs sampling methods for semiparametric models involving the Dirichlet process. The first generation suffered from a severe drawback: the locations of the clusters, or groups of parameters, could essentially become fixed, moving only rarely. Two strategies that have been proposed to create the second generation of Gibbs samplers are integration and appending a second stage to the Gibbs sampler wherein the cluster locations are moved. We show that these same strategies are easily implemented for the sequential importance sampler, and that the first strategy dramatically improves results. As in the case of Gibbs sampling, these strategies are applicable to a much wider class of models. They are shown to provide more uniform importance sampling weights and lead to additional Rao-Blackwellization of estimators.
Keywords
importance sampling , Gibbs sampler , Beta-binomial , posterior distribution , MCMC , Rao-Blackwellization , sequential imputation , Dirichlet process
Journal title
CANADIAN JOURNAL OF STATISTICS
Serial Year
1999
Journal title
CANADIAN JOURNAL OF STATISTICS
Record number
83282
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