Title of article :
Physical properties of low-k films based on the co-condensation of methyltrimethoxysilane with a bridged silsesquioxane
Author/Authors :
B. R. Kim، نويسنده , , J. W. Kang، نويسنده , , K. Y. Lee، نويسنده , , J. M. Son، نويسنده , , M. J. Ko، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2007
Pages :
12
From page :
4591
To page :
4602
Abstract :
Though spin-on organosilicates are considered as the promising candidates of low dielectric constant materials, it is necessary for a successful integration to improve mechanical strength such as modulus and fracture toughness. In this study, five sets of MTMS–BTMSE copolymers were synthesized and characterized while the monomer content of BTMSE (bis(trimethoxysilyl)ethane) was varied from 9.1 to 47.3 mol% vs. MTMS (methyltrimethoxysilane). In parallel with the measurement of dielectric constant, four different tests were carried out to evaluate mechanical properties of the MTMS–BTMSE copolymers. Modulus was measured by the nanoindentation technique and the modified edge lift-off test (MELT) was employed to extract adhesive fracture toughness quantitatively. In addition, residual stress was calculated by sensing the change in radius of curvature of the substrate. The chemical structure of the copolymers was also analyzed with FTIR and NMR. Network formation was enhanced as the amount of BTMSE increased, which led to improvement of modulus and the increase in refractive index and dielectric constant. However, an increasing rate of fracture toughness by the MELT was not proportional to the increase in the amount of BTMSE, which implied that it was necessary to optimize the composition of the copolymers since adhesion strength was conjectured the most critical factor for a successful integration.
Journal title :
Journal of Materials Science
Serial Year :
2007
Journal title :
Journal of Materials Science
Record number :
832943
Link To Document :
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