Title of article :
Recrystallization and fracture characteristics of thin copper wire
Author/Authors :
FEI-YI HUNG? ، نويسنده , , TRUAN-SHENG LUI، نويسنده , , Lihui Chen، نويسنده , , Yuan-Tin Wang، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2007
Pages :
7
From page :
5476
To page :
5482
Abstract :
In this study, the annealed effect (at 150 C ~ 250 C for 1 h) on the tensile mechanical properties of thin copper wires with / = 25 lm (1 mil) was investigated. The microstructural characteristics and the mechanical properties before and after an electric flame-off (EFO) were also studied. Results indicate that with annealing temperatures of more than 200 C, the wires possessed a fully annealed structure, the tensile strength and the hardness decreased, and the elongation was raised significantly. Through recrystallization, equiaxed grains and a few annealed twins formed in the matrix structure. The microstructures of the free air ball (FAB) of the various wires after EFO contained column-like grains. The column-like grains grew from the heat-affected zone (HAZ) to the Cu ball, and the preferred orientation was <100>. According to Weibull’s reliability analysis, the failure rates of all the specimens were the modus of wearfailure. The tensile strength and the reliability of both the 200 C and 250 C annealed wires in the HAZs showed the highest values of all.
Journal title :
Journal of Materials Science
Serial Year :
2007
Journal title :
Journal of Materials Science
Record number :
833063
Link To Document :
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