Title of article
Recrystallization and fracture characteristics of thin copper wire
Author/Authors
FEI-YI HUNG? ، نويسنده , , TRUAN-SHENG LUI، نويسنده , , Lihui Chen، نويسنده , , Yuan-Tin Wang، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2007
Pages
7
From page
5476
To page
5482
Abstract
In this study, the annealed effect (at 150 C
~ 250 C for 1 h) on the tensile mechanical properties of
thin copper wires with / = 25 lm (1 mil) was investigated.
The microstructural characteristics and the
mechanical properties before and after an electric flame-off
(EFO) were also studied. Results indicate that with
annealing temperatures of more than 200 C, the wires
possessed a fully annealed structure, the tensile strength
and the hardness decreased, and the elongation was raised
significantly. Through recrystallization, equiaxed grains
and a few annealed twins formed in the matrix structure.
The microstructures of the free air ball (FAB) of the various
wires after EFO contained column-like grains. The
column-like grains grew from the heat-affected zone
(HAZ) to the Cu ball, and the preferred orientation was
<100>. According to Weibull’s reliability analysis, the
failure rates of all the specimens were the modus of wearfailure.
The tensile strength and the reliability of both the
200 C and 250 C annealed wires in the HAZs showed the
highest values of all.
Journal title
Journal of Materials Science
Serial Year
2007
Journal title
Journal of Materials Science
Record number
833063
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