Author/Authors :
Z. X. Bi، نويسنده , , R. Zhang، نويسنده , , Z. L. Xie، نويسنده , , X. Q. Xiu، نويسنده , , Y. D. Ye، نويسنده , ,
B. Liu، نويسنده , , S. L. Gu، نويسنده , , B. Shen، نويسنده , , Y. Shi، نويسنده , , Y. D. Zheng، نويسنده ,
Abstract :
The initial stages of the cubic indium nitride
film growth at 350 C were studied using low-pressure
metal-organic chemical vapor deposition. The technique of
the pre-deposition of indium was applied, that is, a layer of
indium was first deposited on sapphire surface before the
growth of InN. X-ray diffraction and X-ray photoelectron
spectroscopy show that the pre-deposition of indium is able
to promote the growth of InN films, and meanwhile, suppress
the indium aggregation in the as-grown films. Atomic
force microscopy images of InN films indicate that the predeposition
of indium not only enhances the density of
nucleate sites, but also facilitates the coalescence among
the InN islands. The free energy calculations reveal that the
pre-deposited indium atoms preferentially react with NH
and N radicals after NH3 introduction, which leads to the
formation of InN on the sapphire surface. The preferentially
formed InN is then supposed to be responsible for the
above phenomena.