Title of article :
Crystalline quality and phase purity of CVD diamond films studied by Raman spectroscopy
Author/Authors :
W. Fortunato، نويسنده , , A. J. Chiquito، نويسنده , , J. C. Galzerani، نويسنده , , J. R. Moro، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2007
Pages :
6
From page :
7331
To page :
7336
Abstract :
Two series of diamond films grown—at different temperatures—by two chemical vapor deposition (CVD) methods, i.e., hot filament (HFCVD) and microwave- plasma (MPCVD), were investigated. Raman spectroscopy and scanning electron microscopy were employed to perform a study of both crystalline quality and phase purity of the films grown by the two techniques. It was found that high phase purity can be attained by both methods. However, at high temperatures, the MPCVD technique produced films with higher crystalline quality as compared to those grown by HFCVD. Finally, in order to shed some light into the mechanisms responsible for the lower crystalline quality observed in the HFCVD films, a study based in the phonon confinement model and stress was accomplished.
Journal title :
Journal of Materials Science
Serial Year :
2007
Journal title :
Journal of Materials Science
Record number :
833414
Link To Document :
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