Abstract :
This paper describes the practical design of a portable capacitive load based on insulated gate bipolar transistors
(IGBTs), which is used to measure the I–V characteristics of PV arrays with short-circuit currents up to 80 A and open
circuit voltages up to 800 V. Such measurement allows on-site characterization of PV arrays under real operating conditions
and also provides information for the detection of potential array anomalies, such as broken cells or defective connections.
The presented I–V load is easy to reproduce and low-cost, characteristics that are within the reach of small-scale
organizations involved in PV electrification projects.
2006 Elsevier Ltd. All rights reserved
