Title of article :
Determination of the optical constants of Co(II) complex of schiff base
obtained from 1,8-diaminonaphthalene thin film by infrared spectra
Author/Authors :
F. Yakuphanoglu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
Determination of optical constants of metal complex thin film has been investigated by reflectance and transmittance spectra. The optical
constants (refractive index n, extinction coefficient k, and dielectric constant 3) of the thin film were determined. The real part and imaginary
parts of the complex dielectric constant were calculated. The refractive index dispersion obeyed the Cauchy model and Cauchy parameters
were determined as AZ13.17, BZ9.37!10K6 cm2 and CZ1.58!10K13 cm4 at the range of 1700–4000 cmK1.
q 2005 Elsevier B.V. All rights reserved.
Keywords :
Refractive index dispersion , Complex dielectric constant , Thin film
Journal title :
Journal of Molecular Structure
Journal title :
Journal of Molecular Structure