Title of article :
Investigation of interfacial delamination of a copper-epoxy interface under monotonic and cyclic loading: modeling and evaluation
Author/Authors :
S.K.، Sitaraman, نويسنده , , Xie، Weidong نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-440
From page :
441
To page :
0
Abstract :
Interfacial delamination is of important concern for multilayered microelectronic packages, as it is one of the most common failures observed after reliability test. Most of the work, available in open literature, focus on delamination propagation under monotonic loading rather than delamination propagation under cyclic loading. Interfacial fracture mechanics based methodologies have been proven to be efficient in handling interfacial delamination problem under monotonic loading. In this paper, the principles of interfacial mechanics have been applied in the analysis of interfacial fatigue crack propagation. Fatigue test has been conducted in studying onset of delamination and fatigue crack propagation (FCP) of an interfacial crack along a copper-epoxy interface. Models developed in this study have also been applied in the evaluation of multilayered integrated substrate test vehicles.
Keywords :
E-LEARNING , Technology acceptance model (TAM) , Perceived credibility
Journal title :
IEEE Transactions on Advanced Pakaging
Serial Year :
2003
Journal title :
IEEE Transactions on Advanced Pakaging
Record number :
85770
Link To Document :
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