Author/Authors :
A.، Chatterjee, نويسنده , , D.M.، Fleetwood, نويسنده , , R.D.، Schrimpf, نويسنده , , S.N.، Rashkeev, نويسنده , , S.T.، Pantelides, نويسنده , , R.، Pasternak, نويسنده , , Y.V.، Shirokaya, نويسنده , , B.K.، Choi, نويسنده , , Z.، Marka, نويسنده , , J.K.، Miller, نويسنده , , R.G.، Albridge, نويسنده , , N.H.، Tolk, نويسنده ,
Abstract :
Radiation induced leakage current in a variable-thickness SiO/sub 2/-on-Si structure (1.0-6.5 nm) is detected and characterized by a novel technique, time-dependent electric field-induced second-harmonic generation (EFISH). The role of second-harmonic generation (SHG) for in situ monitoring of the DC field across the oxide and its utility in understanding the dynamics of the carriers in response to their photo-injection is discussed. Plausible mechanisms responsible for radiation-induced leakage current through thin oxides are used to explain the experimental results.
Keywords :
Determination , Continuous , Biodegradable dissolved organic carbon , Cell immobilization , bioreactor
