Title of article :
Comparisons of soft error rate for SRAMs in commercial SOI and bulk below the 130-nm technology node
Author/Authors :
V.، Ferlet-Cavrois, نويسنده , , P.، Roche, نويسنده , , G.، Gasiot, نويسنده , , K.، Forbes, نويسنده , , V.، OSullivan, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
This paper presents experimental ASER on SOI and BULK SRAMs for the 250-, 130-, and 90-nm technologies. The key parameters controlling soft error rate (SER) in these technologies are modeled with Monte Carlo simulations to predict SER to the 65-nm node.
Keywords :
Determination , Continuous , Biodegradable dissolved organic carbon , bioreactor , Cell immobilization
Journal title :
IEEE Transactions on Nuclear Science
Journal title :
IEEE Transactions on Nuclear Science
