Title of article :
Single-event effects in 0.18 (mu)m CMOS commercial processes
Author/Authors :
H.، Shindou, نويسنده , , S.، Kuboyama, نويسنده , , S.، Matsuda, نويسنده , , A.، Makihara, نويسنده , , Y.، Sakaide, نويسنده , , Y.، Tsuchiya, نويسنده , , T.، Arimitsu, نويسنده , , H.، Asai, نويسنده , , Y.، Iide, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-2134
From page :
2135
To page :
0
Abstract :
We evaluated SEEs in sample circuits fabricated at TSMC and Fujitsu with their 0.18 (mu)m CMOS commercial processes. The samples were designed with hardness-by-design methodology. The results were discussed for effective hardening design associated with SEEs.
Keywords :
Cell immobilization , bioreactor , Continuous , Biodegradable dissolved organic carbon , Determination
Journal title :
IEEE Transactions on Nuclear Science
Serial Year :
2003
Journal title :
IEEE Transactions on Nuclear Science
Record number :
86319
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=86319
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